Test Probes

CSI is a global leader in the design and manufacture of burn-in board Test probes. These probes are used for testing and qualification of each individual socket position on any reliability or burn-in board. All test probes are manufactured to withstand numerous testing, that monitors continuity of the contact between the sockets and the PCB.

CSI test probes are engineered with exacting tolerances for proper fit and ease of operation with their mating socket. In all cases the test probe contacts are designed to simulate the IC leads, and contact the socket just as the device would. CSI test probes can be custom manufactured for virtually any socket type regardless of pin count and pitch.

CSI test probes use the highest quality materials from plastics to probe head contacts, with Precise and quality driven manufacturing processes to ensure a quality product. All our probe head contacts are constructed from fully hardened Beryllium-Copper, with hard Gold plating to combine rigidity, low resistance and long life.

At CSI all our efforts are geared towards providing our customer with a top quality test probe that works perfectly the first time and through out the life of the program.

Base Material

Natural or Black Ultem, Natural, Black Delrin, or other specified materials (peek, vespel, etc.)
            
Contact Base Material

Fully hardened Beryllium-Copper
            
Contact Plating

30 µ-inches gold over 50 µ-inches Nickel
            
Typical contact resistance

Less than 100mOHM

Probe Sample Drawings:

• cidACA04474-AA0B-40BD-BCAF-4A229CA32F51
• PROBE-OTQ172(196)-0635-04-RevA2